Have your voice heard among your peers and experts in nanotechnology!
Welcome to Seeing at the Nanoscale VI, the annual scientific conference focusing on nanostructural imaging, characterization, and modification using scanning probe microscopy (SPM) and related techniques.
The conference location is in the center of Berlin, Germany, July 9-11, 2008. Sponsored by Veeco Instruments and supported by
Humboldt University Berlin, Department of Physics, this event includes technical presentations, a nanotechnology poster contest, and a gala dinner to get special flaviour from Berlin.
Highlighted by the conference chairman
Prof. Dr. Jürgen P. Rabe Seeing at the Nanoscale VI provides an optimum forum for "scientists to speak to scientists" on a wide variety of nanotechnology topics with four technical sessions on:
Extending the limits of SPM: high speed scanning, ultra high resolution imaging, multiple probe SPM, novel probes
Georg Schitter TU Delft, Delft, The Netherlands
Toshio Ando Kanazawa University, Kanazawa, Japan
Oscar Custance National Institute for Material Science (NIMS), Tsukuba, Japan
Chanmin Su Veeco Instruments, Santa Barbara, USA
Nataliya Dorozhovets TU Ilmenau, Germany
Jose R. Lozano CSIC, Tres cantos, Madrid, Spain
Hendrik Hölscher Forschungszentrum Karlsruhe, Eggenstein-Leopoldshafen, Germany
Claudia Baier Technische Universität München (TUM), Garching, Germany
From single biomolecules to cells: using AFM and combined AFM-optical
Hans Oberleithner Universitat Muenster, Muenster, Germany
Daniel Mueller BIOTEC, Dresden, Germany
Clive Roberts Chair of Pharmaceutical Nanotechnology, School of Pharmacy and Director of the Nottingham Nanotechnology and Nanoscience Centre The University of Nottingham, United Kingdom
Hua Liang Humboldt University Berlin, Germany
Tomoji Kawai Osaka University, Osaka, Japan
Thomas Schmid ETH Zürich, Zürich, Switzerland
Annalisa Relini University of Genoa, Italy
Nikolay Buzhynskyy Institut Curie, Paris, France
Next generation materials and polymer systems
G.J. Vancso Universiteit Twente, Enschede, The Netherlands
Jiro Kumaki Yashima Super-structured Helix Project, ERATO, JST, Nagoya, Japan
Christian Fretigny CNRS, Paris, France
Christiane Norenberg University of Oxford, United-Kingdom
Andrey Klymchenko University Luis Pasteur, Strasbourg, France
Clemens Liedel Universität Bayreuth, Germany
Robert Magerle Technische Universtität Chemnitz, Germany
Jacob Sagiv Weizmann Institute, Rehovot, Israël
Beyond topography: measurement of physical properties at the Nanoscale
-nanomechanical, electrical, optical, magnetic and thermal
Robert W. Stark Ludwig-Maximilians-Universitat Muenchen, Munich, Germany
Wilfried Vandervorst, IMEC, Leuven, Belgium and Dept. Physics, KULeuven, Belgium
Ozgur Sahin Harvard University, USA
Patrick Fiorenza CNR-IMM, Catania, Italy
Natalia Erina Veeco Instruments, Santa Barbara, USA
Carlos J. Gomez CSIC, Tres Cantos, Madrid, Spain
Tim Albrecht Imperial College London, United-Kingdom
Doerthe Melitta Eisele Humboldt University Berlin, Germany
Book the dates in your diary! 9-11 July 2008