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Electronic Materials

 

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View results for: Metrology & Instrumentation Metrology & Instrumentation Systems

AFM /SPM

• Dimension 3100
• Dimension 5000 Scanning Probe Microscope
• Dimension V Scanning Probe Microscope (SPM)

Automated AFM / AFP

• Dimension AFP
• Dimension X3D for Data Storage

Optical Profilers

• Wyko NT9800
• Wyko NT9300

Stylus Profilers

• Dektak 150
• Dektak 8